JPS6159657B2 - - Google Patents

Info

Publication number
JPS6159657B2
JPS6159657B2 JP55064982A JP6498280A JPS6159657B2 JP S6159657 B2 JPS6159657 B2 JP S6159657B2 JP 55064982 A JP55064982 A JP 55064982A JP 6498280 A JP6498280 A JP 6498280A JP S6159657 B2 JPS6159657 B2 JP S6159657B2
Authority
JP
Japan
Prior art keywords
insulating film
terminal
voltage
switching element
voltage application
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55064982A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56161650A (en
Inventor
Heihachi Matsumoto
Kokichi Sawada
Chukichi Adachi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP6498280A priority Critical patent/JPS56161650A/ja
Publication of JPS56161650A publication Critical patent/JPS56161650A/ja
Publication of JPS6159657B2 publication Critical patent/JPS6159657B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP6498280A 1980-05-15 1980-05-15 Semiconductor element for appraisement Granted JPS56161650A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6498280A JPS56161650A (en) 1980-05-15 1980-05-15 Semiconductor element for appraisement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6498280A JPS56161650A (en) 1980-05-15 1980-05-15 Semiconductor element for appraisement

Publications (2)

Publication Number Publication Date
JPS56161650A JPS56161650A (en) 1981-12-12
JPS6159657B2 true JPS6159657B2 (en]) 1986-12-17

Family

ID=13273764

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6498280A Granted JPS56161650A (en) 1980-05-15 1980-05-15 Semiconductor element for appraisement

Country Status (1)

Country Link
JP (1) JPS56161650A (en])

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63312648A (ja) * 1987-06-15 1988-12-21 Nippon Telegr & Teleph Corp <Ntt> 半導体集積回路チップの製法
JP2591800B2 (ja) * 1988-08-12 1997-03-19 沖電気工業株式会社 半導体集積回路の欠陥検出方法及び欠陥検出用回路

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5051267A (en]) * 1973-09-07 1975-05-08
JPS5332679A (en) * 1976-09-08 1978-03-28 Hitachi Ltd Easy to inspect lsi mounting package

Also Published As

Publication number Publication date
JPS56161650A (en) 1981-12-12

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